Description

This edited volume emphasizes on applications of X-ray Diffraction technique in material and nano science. The contents of this book are divided into twelve chapters which comprehensively describe the state-of-the-art in characterizations and determination of structures using X-ray diffraction data with necessary experimental details. The interdisciplinary multidimensional views of this volume will encourage and attract the young students and researchers towards this subject.
Noted researchers and academicians across the country have contributed their valuable articles on current issues to this volume. We hope this volume will be a useful resource for all who work in this field.