Brand: Elsevier Science & Technology
Product Code: NAP-FSL361
Availability: 1

Author : CISM, John Rittinghouse PhD|CISM, William M. Hancock PhD CISSP|Rittinghouse, John W.|Hancock, Bill
ISBN : 9780080441030
Year of Publication: 34200

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Following the breakthrough in the last decade in identifying the key parameters for time and depth imaging in anisotropic media and developing practical methodologies for estimating them from seismic data, Seismic Signatures and Analysis of Reflection Data in Anisotropic Media primarily focuses on the far reaching exploration benefits of anisotropic processing.

This volume provides the first comprehensive description of reflection seismic signatures and processing methods in anisotropic media. It identifies the key parameters for time and depth imaging in transversely isotropic media and describes practical methodologies for estimating them from seismic data. Also, it contains a thorough discussion of the important issues of uniqueness and stability of seismic velocity analysis in the presence of anisotropy. The book contains a complete description of anisotropic imaging methods, from the theoretical background to algorithms to implementation issues. Numerous applications to synthetic and field data illustrate the improvements achieved by the anisotropic processing and the possibility of using the estimated anisotropic parameters in lithology discrimination.




Focuses on the far reaching exploration benefits of anisotropic processing
First comprehensive description of reflection seismic signatures and processing methods in anisotropic media
Product Info
Author : CISM, John Rittinghouse PhD|CISM, William M. Hancock PhD CISSP|Rittinghouse, John W.|Hancock, Bill
ISBN : 9780080441030
Year of Publication: 34200

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